Double Pulse Testing

The double pulse test is widely used to test the parameters of power MOSFETs and power IGBT’s. The circuit replicates the type of inductive load that is typical in power converter design. The test can be used to measure the semiconductor energy loss during switch on/off as well as the reverse recovery time of the diode.

The CWTMini50HF is the perfect choice for measuring the current flowing in modern power devices including SiC semiconductors. The 50MHz bandwidth is sufficient to measure a rise time of 12ns without distortion and the measurement delay is predictable and repeatable, which enables the user to correctly de-skew the current measurement and calculate energy loss.

The coil contains no magnetic materials and has a small cross section which minimises the inductance inserted in the primary circuit which could negatively affect the maximum achievable switching speed of the device being tested.